DocumentCode
400150
Title
The design scheme of test bed used to test automotive ignition switches
Author
Liu, Wenjie ; Zhang, Maoqin ; Rui, Yannian
Author_Institution
Sch. of Mech. & Electron. Eng., Suzhou Univ., China
Volume
1
fYear
2003
fDate
12-15 Oct. 2003
Firstpage
852
Abstract
Automotive ignition switch is a very important part in a vehicle. The quality of ignition switch will affect directly the vehicle´s starting ability. So every batch of ignition switches need to be sample surveyed according to strict technique and technology requirements published by China Government. The ignition switch´s test conditions, test items, and targets are also defined. According to the above-mentioned standards, the ignition switch´s test bed we designed has the functions as: 1) Display how many work cycles have passed while the current samples are being tested. 2) Display in real time every step´s current passing through the samples. 3) Can be set flexibly the number of steps and the angle of every step according to different types of ignition switches. 4) Can be set flexibly the rotary speed and residence time. 5) Capture the number of work cycles when first error appears in each step. 6) Can be set the number of work cycles after which keys can be inserted or pulled out of the samples. Can be set the number of work cycles after which electric current or voltage begins to be measured.
Keywords
automotive engineering; electric current; electric ignition; gears; stepping motors; switchgear; vehicles; China government; automotive ignition switches; electric current; electric voltage; gear; ignition switch quality; ignition switches targets; ignition switches test bed; ignition switches test condition; ignition switches test items; residence time; rotary speed; step motor; vehicles starting ability; work cycles; Automotive engineering; Current measurement; Displays; Electric variables measurement; Government; Ignition; Switches; Testing; Vehicles; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Transportation Systems, 2003. Proceedings. 2003 IEEE
Print_ISBN
0-7803-8125-4
Type
conf
DOI
10.1109/ITSC.2003.1252070
Filename
1252070
Link To Document