DocumentCode
40031
Title
Minimized Device Junction Leakage Current at Forward-Bias Body and Applications for Low-Voltage Quadruple-Stacked Common-Gate Amplifier
Author
To-Po Wang
Author_Institution
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Volume
61
Issue
5
fYear
2014
fDate
May-14
Firstpage
1231
Lastpage
1236
Abstract
Minimized device junction leakage current at forward-bias body and applications for low-voltage quadruple-stacked common-gate (CG) low-noise amplifier (LNA) is presented in this paper. Diode-connected MOSFETs are proposed to insert between the device bulks and forward bias, resulting in the back-to-back connected diodes and minimized junction leakage current. In addition, interstage matching networks are introduced to the quadruple-stacked CG stages to significantly enhance the small-signal gain of the amplifier. Based on the proposed circuit architectures, the fabricated 0.18-μm complementary metal-oxide-semiconductor LNA can operate at 0.5 V low supply voltage, exhibiting a measured low dc power dissipation of 6.3 mW, high gain of 16 dB, and low noise figure of 5.6 dB at 27.5 GHz. In addition, the theories for analyzing the proposed quadruple-stacked CG amplifier are given in detail, and the mechanisms are validated by experiments.
Keywords
CMOS integrated circuits; MOSFET; leakage currents; low noise amplifiers; low-power electronics; complementary metal-oxide-semiconductor LNA; device junction leakage current; diode-connected MOSFET; forward-bias body; gain 16 dB; interstage matching networks; low-voltage quadruple-stacked common-gate low noise amplifier; noise figure 5.6 dB; power 6.3 mW; size 0.18 mum; small-signal gain; voltage 0.5 V; Gain; Impedance; Inductors; Junctions; Leakage currents; MOSFET; Noise; Diode-connected MOSFET; low-noise amplifier (LNA); low-noise amplifier (LNA).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2309682
Filename
6774866
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