DocumentCode
400411
Title
Ionisation dead space and the super-APD
Author
Rees, Graham ; David, John
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, UK
Volume
2
fYear
2003
fDate
27-28 Oct. 2003
Firstpage
995
Abstract
In this paper we have seen carriers ionise when the energy gained from the field exceeds the energy loss to phonons by the ionisation threshold energy. Carriers are injected either optically or by impact ionisation, are generated ´cool´ and they must travel some distance down the electric field before they ´heat´ and their energy distribution achieves equilibrium with the local field. During this ´dead space´ region their ionisation coefficient is very small. The impact ionisation process then loses some of it´s randomness, also reducing the scatter in M and hence reducing excess noise. In thin devices the measured noise falls, and the effect is well described by treatments which allow for the the effects of dead space. This noise reduction in thin avalanche regions is also seen in a wide variety of III-V materials and in SiC and these results have demonstrated that APDs can be simultaneously both quiet and fast.
Keywords
III-V semiconductors; avalanche photodiodes; electron impact ionisation; noise measurement; phonons; photoionisation; silicon compounds; III-V material; SiC; avalanche photodiode; carrier injection; electric field; energy distribution; impact ionisation process; ionisation coefficient; ionisation dead space; ionisation threshold energy; noise reduction; optical ionisation; phonons; super-APD; thin avalanche region; Energy loss; Extraterrestrial measurements; III-V semiconductor materials; Impact ionization; Noise measurement; Noise reduction; Optical scattering; Phonons; Silicon carbide; Space exploration;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1253142
Filename
1253142
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