• DocumentCode
    400411
  • Title

    Ionisation dead space and the super-APD

  • Author

    Rees, Graham ; David, John

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, UK
  • Volume
    2
  • fYear
    2003
  • fDate
    27-28 Oct. 2003
  • Firstpage
    995
  • Abstract
    In this paper we have seen carriers ionise when the energy gained from the field exceeds the energy loss to phonons by the ionisation threshold energy. Carriers are injected either optically or by impact ionisation, are generated ´cool´ and they must travel some distance down the electric field before they ´heat´ and their energy distribution achieves equilibrium with the local field. During this ´dead space´ region their ionisation coefficient is very small. The impact ionisation process then loses some of it´s randomness, also reducing the scatter in M and hence reducing excess noise. In thin devices the measured noise falls, and the effect is well described by treatments which allow for the the effects of dead space. This noise reduction in thin avalanche regions is also seen in a wide variety of III-V materials and in SiC and these results have demonstrated that APDs can be simultaneously both quiet and fast.
  • Keywords
    III-V semiconductors; avalanche photodiodes; electron impact ionisation; noise measurement; phonons; photoionisation; silicon compounds; III-V material; SiC; avalanche photodiode; carrier injection; electric field; energy distribution; impact ionisation process; ionisation coefficient; ionisation dead space; ionisation threshold energy; noise reduction; optical ionisation; phonons; super-APD; thin avalanche region; Energy loss; Extraterrestrial measurements; III-V semiconductor materials; Impact ionization; Noise measurement; Noise reduction; Optical scattering; Phonons; Silicon carbide; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7888-1
  • Type

    conf

  • DOI
    10.1109/LEOS.2003.1253142
  • Filename
    1253142