Title :
Combined FDTD/macromodel simulation of interconnected digital devices
Author :
Grivet-Talocia, S. ; Stievano, I.S. ; Maio, I.A. ; Canavero, F.G.
Author_Institution :
Dipt. Elettronica, Politecnico di Torino, Italy
Abstract :
Behavioral models of digital devices based on Radial Basis Functions (RBF) are incorporated into a Finite-Difference Time-Domain (FDTD) solver for full-wave analysis of interconnected drivers and receivers. This modeling strategy allows a very accurate and efficient full-wave solution of interconnection structures with possibly complex geometry including the nonlinear and dynamic effects of real-world digital devices, without the need of detailed transistor-level models. Examples of signal integrity and field coupling analysis are shown.
Keywords :
digital integrated circuits; finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; radial basis function networks; FDTD/macromodel simulation; behavioral model; driver; dynamic effects; field coupling; full-wave analysis; interconnected digital device; nonlinear effects; radial basis function; receiver; signal integrity; Analytical models; Circuit simulation; Computational modeling; Driver circuits; Electromagnetic compatibility; Finite difference methods; Geometry; Integrated circuit interconnections; Solid modeling; Time domain analysis;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253664
