Characterization of a Superconducting NbSi Transition Edge Sensor for TeSIA

Author

Zhang, Wensheng ; Zhong, J.Q. ; Miao, W. ; Duan, W.Y. ; Yao, Q.J. ; Shi, S.C. ; Martino, J. ; Pajot, F. ; Prele, D. ; Voisin, F. ; Piat, M.

Author_Institution

Key Lab. of Radio Astron., Purple Mountain Obs., Nanjing, China

Volume

25

Issue

3

fYear

2015

fDate

Jun-15

Firstpage

1

Lastpage

4

Abstract

We report on the performance of a superconducting NbSi transition edge sensor (TES), which is co-evaporated on a suspended SiO/SiN/SiO trilayer membrane. The temperature sensitivity coefficient (α) calculated from the measured resistive transition curve is as high as 200. The current-voltage characteristics were measured at bath temperatures varying from 288 mK to 440 mK using a two-stage SQUID amplifier, from which the thermal conductance (G) was found to be 345 pW/K. We also measured the current noise at different bias voltages at 288 mK. The obtained electrical noise equivalent power (NEP) from its calculated current responsivity and measured current noise is about 8 × 10^-17 W/√Hz. In addition, the preliminary measurement results of time domain multiplexing scheme based on the superconducting quantum interference devices (SQUIDs) and an application specific integrated circuit (ASIC) are presented.

Keywords

SQUIDs; application specific integrated circuits; astronomical telescopes; niobium compounds; thermal conductivity; NbSi; TeSIA; application specific integrated circuit; coevaporation; current noise; current responsivity; current-voltage characteristics; electrical noise equivalent power; resistive transition curve; superconducting quantum interference devices; superconducting transition edge sensor; temperature 288 mK to 440 mK; temperature sensitivity coefficient; thermal conductance; trilayer membrane; two stage SQUID amplifier; Application specific integrated circuits; Arrays; Current measurement; Noise; SQUIDs; Superconducting integrated circuits; Temperature measurement; NbSi; TDM; Transition edge sensor; thermal conductance; transition edge sensor;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2014.2364138

Filename

6930745