• DocumentCode
    40194
  • Title

    VAST: Virtually Associative Sector Translation for MLC Storage Systems

  • Author

    Jen-Wei Hsieh ; Yu-Cheng Zheng ; Yong-Sheng Peng ; Po-Hung Yeh

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • Volume
    32
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1137
  • Lastpage
    1150
  • Abstract
    In recent years, multilevel cell Flash memory (MLC), which stores two or more bits per cell, has gradually replaced single-level cell flash memory due to its lower cost and higher density. However, MLC also brings new constraints, i.e., no partial programming and sequential page writes within a block, to the management. This paper proposes a virtual log-block-based hybrid-mapping scheme, referred to as virtually associative sector translation (VAST), for MLC storage systems. Unlike traditional hybrid-mapping schemes, VAST is a combination of block-level and segment-level mappings and manages log blocks in a flexible manner. The goals of our research are to avoid timeout by decreasing dummy-page writes, to get a better response time by decreasing live-page copies, and to prolong the life span of flash memory by decreasing total block erasures. Our trace-driven simulation shows that VAST could reduce up to 90% of dummy-page writes, 22%~52% of live-page copies, and 55%~83% of block erasures, compared to well-known hybrid-mapping schemes.
  • Keywords
    flash memories; MLC storage system; VAST; block erasure; block-level mapping; dummy-page write; live-page copy; log block management; multilevel cell flash memory; segment-level mapping; trace-driven simulation; virtual log-block-based hybrid-mapping scheme; virtually associative sector translation; Ash; Indexes; Memory management; Programming; Radiation detectors; Reliability; Switches; Embedded systems; flash memory; flash translation layer (FTL); storage systems;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2250582
  • Filename
    6559102