• DocumentCode
    4025
  • Title

    Gate-Induced Source Tunneling FET (GISTFET)

  • Author

    Pan, Andrew ; Chi On Chui

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA, USA
  • Volume
    62
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2390
  • Lastpage
    2395
  • Abstract
    We propose a device, the gate-induced source tunneling FET (GISTFET), that uses two gate work functions to modulate lateral tunneling. The performance of the device is largely independent of the details of the chemical doping profile, potentially freeing device design from issues related to solid solubility, junction abruptness, and dopant variability. We demonstrate the advantages of the device over conventional TFETs using ballistic quantum transport simulations and discuss the possible role of scattering. The proposed device can be used to make all types of tunneling devices, but is particularly important for enabling steep swing, high current p-type transistors.
  • Keywords
    ballistic transport; semiconductor device models; semiconductor doping; tunnel transistors; GISTFET; ballistic quantum transport simulations; chemical doping profile; device design; dopant variability; gate work functions; gate-induced source tunneling FET; junction abruptness; lateral tunneling; p-type transistors; solid solubility; tunneling devices; Doping; Junctions; Logic gates; Metals; Transistors; Tunneling; Interband tunneling; metal gate; metal work function (WF); nonequilibrium green’s function (NEGF); nonequilibrium green???s function (NEGF); tunneling FET (TFET); tunneling FET (TFET).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2445343
  • Filename
    7150407