A Fully Digital ASK Demodulator With Digital Calibration for Bioimplantable Devices

Author

Kafi Kangi, Mohammad ; Maymandi-Nejad, Mohammad ; Nasserian, Mahshid

Author_Institution

Dept. of Electr. Eng., Ferdowsi Univ. of Mashhad, Mashhad, Iran

Volume

23

Issue

8

fYear

2015

fDate

Aug. 2015

Firstpage

1557

Lastpage

1561

Abstract

A new fully digital high-efficiency ASK demodulator for detecting data via inductive link is proposed. The proposed demodulator does not use any passive component and is compatible with standard CMOS digital technology. The modulation index, modulation rate, and power consumption of the proposed structure are <;4%, 100%, and 118.2 μW, respectively, at the carrier frequency of 13.56 MHz. Design issues of the demodulator are discussed in detail. A calibration technique is also proposed for the demodulator which compensates the impact of PVT variations as well as coil displacements in case it is used in an inductive link data and power transfer system. The designed circuit is implemented in the 0.18-μm CMOS technology.

Keywords

CMOS digital integrated circuits; amplitude shift keying; biomedical electronics; calibration; coils; demodulators; inductive power transmission; integrated circuit design; prosthetics; radio links; telemedicine; PVT variation impact compensation; bioimplantable device; carrier frequency; circuit design; coil displacement impact compensation; data detection; demodulator design; digital calibration; frequency 13.56 MHz; fully digital ASK demodulator; high-efficiency ASK demodulator; inductive link data; modulation index; modulation rate; passive component; power 118.2 muW; power consumption; power transfer system; size 0.18 mum; standard CMOS digital technology compatibility; Amplitude shift keying; Calibration; Coils; Demodulation; Detectors; Integrated circuit modeling; ASK demodulator (ASKD); bioimplantable devices; data transmission; digital calibration; inductive link; pulse shrinking circuit;

fLanguage

English

Journal_Title

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

Publisher

ieee

ISSN

1063-8210

Type

jour

DOI

10.1109/TVLSI.2014.2343946

Filename

6881753