DocumentCode
403496
Title
Efficient static compaction of test sequence sets through the application of set covering techniques
Author
Dimopoulos, Michael ; Linardis, Panagiotis
Author_Institution
Dept. of Informatics, Aristotle Univ. of Thessaloniki, Greece
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
194
Abstract
The test sequence compaction problem is modelled here, as a set covering problem. This formulation enables the straightforward application of set covering methods for compaction. Because of the complexity inherent in the first model, a second more efficient, formulation is proposed where the test sequences are modelled as matrix columns with variable costs (number of vectors). Further, matrix reduction rules appropriate to the new formulation, which do not affect the optimality of the solution, are introduced. Finally, the reduced problem is minimized with a branch & bound algorithm. Experiments on a large number of test sets show significant reductions to the original problem by simply using the presented reduction rules. Experimental results comparing our method with others form the literature and also with the absolute minima of the examples, computed separately with the MINCOV algorithm, support the potential of the proposed approach.
Keywords
automatic test pattern generation; logic testing; sequential circuits; MINCOV algorithm; absolute minima; branch & bound algorithm; matrix columns; matrix reduction rules; set covering techniques; static compaction; test sequence sets; variable costs; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Compaction; Costs; Electrical fault detection; Sequential analysis; Sequential circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268848
Filename
1268848
Link To Document