• DocumentCode
    403535
  • Title

    Stimuli generation with late binding of values

  • Author

    Ziv, Avi

  • Author_Institution
    IBM Res. Lab., Haifa, Israel
  • Volume
    1
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    558
  • Abstract
    Generating test-cases that reach corner cases in the design is one of the main challenges in the functional verification of complex designs. In this paper, we describe a new technique that increases the ability of test generators by delaying assignment of values in the generated stimuli, until these values are used in the design. This late-binding allows the generator to have a more accurate view of the state of the design, and thus it can better choose the correct values. Experimental results show that late-binding can significantly improve coverage, with a reasonable penalty in simulation time.
  • Keywords
    automatic test pattern generation; circuit simulation; digital simulation; formal verification; hardware-software codesign; dynamic generation; functional verification; hardware design cycle; late value binding; simulation time; stimuli generation; test generators; test-cases generation; Circuit simulation; Computational modeling; Costs; Delay; Event detection; Hardware; Investments; Laboratories; Pipelines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1268904
  • Filename
    1268904