Functional coverage metric generation from temporal event relation graph

Author

Kwon, Young-Su ; Kyung, Chong-Min

Author_Institution

Lab. of VLSI Syst., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

Volume

1

fYear

2004

fDate

16-20 Feb. 2004

Firstpage

670

Abstract

Functional coverage is a technique which can be used for checking the completeness of test vectors. In this paper, automatic generation of temporal events for functional coverage is proposed. The TERG (Temporal Event Relation Graph) is the graph where the nodes represent basic temporal property and the edges represent the time-shift value between two properties. Hierarchical temporal events are generated by traversing TERG such that invalid or irrelevant properties are eliminated. Concurrent edge groups in TERG make it possible to generate more comprehensive temporal properties.

Keywords

automatic test pattern generation; formal verification; graph theory; temporal logic; TERG; concurrent edge groups; functional coverage; hierarchical temporal events; metric generation; temporal event relation graph; temporal property; test vector completeness checking; time-shift value; Automatic testing; Boolean functions; Character generation; Design automation; Europe; Formal verification; Monitoring; Specification languages; Time measurement; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings

ISSN

1530-1591

Print_ISBN

0-7695-2085-5

Type

conf

DOI

10.1109/DATE.2004.1268923

Filename

1268923