DocumentCode
403563
Title
A digital test for first-order ΣΔ modulators
Author
Leger, Gildas ; Rueda, Adoración
Author_Institution
Instituto de Microelectron. de Sevilla, Sevilla Univ., Spain
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
706
Abstract
This paper presents a digital structural test for first-order Sigma-Delta modulators. A periodic digital sequence is used as a stimulus to obtain a signature of the integrator leakage. This parameter is known to be related to the modulator precision and its estimation is of great importance to assess if the modulator works as expected. As the proposed technique is fully digital, it is especially suitable to test modulators embedded in complex mixed-signal circuits.
Keywords
integrated circuit testing; mixed analogue-digital integrated circuits; modulators; sigma-delta modulation; digital structural test; first-order Sigma-Delta modulators; integrator leakage signature; mixed-signal circuits; modulator precision; modulator testing; periodic digital sequence; Automatic testing; Circuit testing; Counting circuits; Delay; Delta modulation; Delta-sigma modulation; Design automation; Digital modulation; Europe; Mathematical model;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268940
Filename
1268940
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