• DocumentCode
    403568
  • Title

    Concurrent sizing, Vdd and Vth assignment for low-power design

  • Author

    Srivastava, Ashish ; Sylvester, Dennis ; Blaauw, David

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    718
  • Abstract
    We present a sensitivity-based algorithm for total power including dynamic and subthreshold leakage power minimization using simultaneous sizing, Vdd and Vth assignment. The proposed algorithm is implemented and tested on a set of combinational benchmark circuits. A comparison with traditional CVS based algorithms demonstrates the advantage of the algorithm including an average power reduction of 37% at primary input activities of 0.1. We also investigate the impact of various low Vdd values on total power savings.
  • Keywords
    benchmark testing; leakage currents; low-power electronics; minimisation; power supply circuits; sensitivity analysis; CVS-based algorithms; Vdd assignment; Vth assignment; combinational benchmark circuits; concurrent sizing; dynamic leakage; low-power design; power minimization; power reduction; sensitivity-based algorithm; subthreshold leakage; Algorithm design and analysis; Automatic testing; Circuit testing; Delay; Design automation; Europe; Power dissipation; Signal restoration; Switching circuits; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1268946
  • Filename
    1268946