DocumentCode
403679
Title
A CAD methodology and tool for the characterization of wide on-chip buses
Author
Elfadel, I.M. ; Deutsch, A. ; Kopcsay, G. ; Rubin, B. ; Smith, H.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
3
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
144
Abstract
In this paper, we describe a CAD methodology for the full electrical characterization of high-performance, on-chip data buses. The goal of this methodology is to allow the accurate modeling and analysis of wide, on-chip data buses as early as possible in the design cycle. The modeling is based on a manufacturing (rather than design-manual) description of the back-end-of-the-line (BEOL) cross section of a given technology and on a full yet contained description of the power-ground mesh in which the data bus is embedded. One major aspect of the resulting electrical models is that they allow the designer to evaluate the wide bus from the three viewpoints of signal timing, crosstalk (both inductive and capacitive), and common-mode signal integrity. Another major aspect is that they take into account such important high-frequency phenomena as the dependence of the current return-path resistance on frequencies. The CAD methodology described in this paper has been extensively correlated with on-chip hardware measurements.
Keywords
SPICE; circuit CAD; integrated circuit modelling; system buses; CAD tool; back end-of-the line; common mode signal integrity; crosstalk; electrical characterization; electrical modelling; on-chip data buses; onchip hardware measurements; signal timing; wideband extraction; Crosstalk; Data buses; Design automation; Electric resistance; Electrical resistance measurement; Frequency; Hardware; Signal design; Timing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1269221
Filename
1269221
Link To Document