DocumentCode

403786

Title

EEPROM memory: threshold voltage built in self diagnosis

Author

Portal, J.M. ; Aziza, H. ; Née, D.

Author_Institution

ST-Microelectronics

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

23

Lastpage

28

Keywords

Circuit testing; Data mining; EPROM; Fabrication; Feature extraction; Nonvolatile memory; Portals; Smart cards; Threshold voltage; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270821

Filename

1270821