DocumentCode

403822

Title

Bist for deep submicron asic memories with high performance application

Author

Powell, Theo J. ; Cheng, Wu-Tung ; Rayhawk, Joseph ; Samman, Omer ; Policke, Paul ; Lai, Sherry

Author_Institution

Texas Instruments Inc.

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

386

Lastpage

392

Keywords

Application specific integrated circuits; Built-in self-test; Frequency; Geometry; Instruments; Logic arrays; Random access memory; Read-write memory; Testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270862

Filename

1270862