DocumentCode

403864

Title

Tribute board and platform test methodology: intel´s next generation test and validation methodology for platforms

Author

Nejedlo, Jay J.

Author_Institution

Intel Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

783

Lastpage

783

Keywords

Built-in self-test; System testing; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270908

Filename

1270908