• DocumentCode
    403885
  • Title

    Deformations of ic structure in test and yield learning

  • Author

    Maly, W. ; Gattiker, A. ; Zanon, T. ; Vogels, T. ; Blanton, R.D. ; Storey, T.

  • Author_Institution
    Carnegie Mellon University
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    856
  • Lastpage
    865
  • Keywords
    Boolean algebra; Circuit faults; Circuit testing; Deformable models; Geometry; Integrated circuit layout; Integrated circuit modeling; Integrated circuit testing; Pulp manufacturing; Taxonomy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271071
  • Filename
    1271071
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403885