DocumentCode

403906

Title

Structural delay testing of latch-based high-speed pipelines with time borrowing

Author

Chung, Kun Young ; Gupta, Sandeep K.

Author_Institution

University of Southern California

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1089

Lastpage

1097

Keywords

Circuit faults; Circuit testing; Clocks; Costs; Delay effects; Design for testability; Latches; Logic design; Pipeline processing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271097

Filename

1271097