DocumentCode

403907

Title

DFFT design for functional testability

Author

Konuk, Haluk ; Mao, Luhong

Author_Institution

Broadcom Corporation

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1105

Lastpage

1114

Keywords

Automatic test pattern generation; Automatic testing; Debugging; Logic design; Logic testing; Modems; Pins; Process design; Semiconductor device testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271099

Filename

1271099