• DocumentCode
    403933
  • Title

    ITC2003 improving wireless product testing: an opportunity for university and industry collaboration

  • Author

    Paviol, Jim

  • Author_Institution
    Intersil Corporation -Wiyeless Division
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1289
  • Lastpage
    1289
  • Keywords
    Built-in self-test; Calibration; Circuit testing; Circuit topology; Collaboration; Integrated circuit testing; Probes; Production; Radio frequency; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271129
  • Filename
    1271129
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403933