DocumentCode

403956

Title

Jitter test in production for high speed serial links

Author

Cai, Yi

Author_Institution

Agere Systems

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1312

Lastpage

1312

Keywords

Built-in self-test; Histograms; Instruments; Jitter; Performance evaluation; Pins; Production systems; System performance; System testing; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271152

Filename

1271152