• DocumentCode
    40524
  • Title

    A PSRR Enhancing Method for GRO TDC Based Clock Generation Systems

  • Author

    Yutao Liu ; Yizhi Han ; Woogeun Rhee ; Tae-Young Oh ; Zhihua Wang

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • Volume
    61
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    680
  • Lastpage
    688
  • Abstract
    This paper discusses a supply noise sensitivity problem of the gated ring oscillator (GRO) based time-to-digital converter (TDC) in all-digital phase-locked loops (ADPLLs) and presents a power supply rejection ratio (PSRR) enhancing method. A replica supply noise monitoring circuit is designed to track supply noise and enable feed-forward error cancellation for high PSRR TDC design. A prototype ADPLL with the proposed self-monitored TDC is implemented in 65 nm CMOS to evaluate the supply noise sensitivity of the TDC in the frequency domain. Intermodulation spur generation problem due to noise coupling is also addressed and demonstrated in hardware. The experimental results show that the proposed method effectively suppresses supply noise induced spurs at the output of the ADPLL, achieving the PSRR of 27 dB and 38 dB with 1 MHz supply noise and 5 MHz intermodulation noise respectively.
  • Keywords
    CMOS digital integrated circuits; clocks; digital phase locked loops; feedforward; integrated circuit noise; oscillators; time-digital conversion; ADPLLs; CMOS technology; GRO TDC based clock generation systems; all-digital phase-locked loops; feedforward error cancellation; frequency 1 MHz; frequency 5 MHz; gated ring oscillator; intermodulation noise; intermodulation spur generation problem; noise coupling; replica supply noise monitoring circuit; size 65 nm; supply noise sensitivity problem; time-to-digital converter; Clocks; Couplings; Monitoring; Noise; Phase locked loops; Radiation detectors; Voltage-controlled oscillators; Gated ring oscillator; on-chip testability; phase-locked loop (PLL); power supply rejection ratio (PSRR); supply noise monitor; time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2013.2284177
  • Filename
    6693742