Title :
Edge diffraction induced near-field contrast in subwavelength structure
Author :
Chou, Hsieh-Li ; Chen, Yi-Chun ; Wei, PekKuen
Author_Institution :
Inst. of Appl. Sci. & Eng. Res., Acad. Sinica, Taipei, Taiwan
Abstract :
Optical near-field in subwavelength air-dielectric structure is studied by a collection-mode near-field optical microscopy. Concentrated optical near-field and large polarization anisotropy at the dielectric regions are measured. From the simulation of finite-difference time-domain method, we conclude the edge diffraction dominating the optical near-field distribution.
Keywords :
dielectric polarisation; finite difference time-domain analysis; image processing; light diffraction; near-field scanning optical microscopy; photonic band gap; dielectric regions; edge diffraction; finite-difference time-domain method; near-field contrast; near-field optical microscopy; optical near-field distribution; polarization anisotropy; subwavelength air-dielectric structure; subwavelength structure; Dielectric measurements; Geometrical optics; Optical diffraction; Optical films; Optical microscopy; Optical modulation; Optical refraction; Optical variables control; Refractive index; Surfaces;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1274585
