Title :
A compact flash memory for embedded system applications
Author :
Wu Dong ; Zhu Jun
Abstract :
A 64 Kb flash memory designed for embedded system is described in this paper. The device is designed to be programed in-system using the standard 5 V power supply. Based on the negative-gate source-side FN erase, the maximum high voltage in embedded system is reduced. In addition, compact system architecture, an area-saving row decoder and a negative voltage test circuit are illustrated. Furthermore, simulation shows that the proposed architecture is feasible to different storage density. All these features make it more suitable to be used in embedded systems.
Keywords :
decoding; embedded systems; flash memories; 5 V; 64 Kbyte; Fowler-Nordheim erase techniques; compact system architecture; embedded system applications; flash memory; memory storage density; negative gate source side FN erase techniques; negative voltage test circuit; row decoder;
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
Print_ISBN :
0-7803-7889-X
DOI :
10.1109/ICASIC.2003.1277593