DocumentCode
406359
Title
Voltage-sensitive optical mapping for atrial fibrillation ablation treatment
Author
Furman, Michael D. ; Simonotto, Jennifer D. ; Beaver, Thomas M. ; Spano, Mark L. ; Ditto, William L. ; Liu, Gang ; Kavanagh, Katherine M.
Author_Institution
Dept. of Biomed. Eng., Florida Univ., Gainesville, FL, USA
Volume
1
fYear
2003
fDate
17-21 Sept. 2003
Firstpage
145
Abstract
In recent years radiofrequency energy sources have been utilized in patients with atrial fibrillation to ablate atrial tissue and restore normal sinus rhythm. Radiofrequency ablations significantly minimize time in surgery, and hence postoperative complications, but as yet do not duplicate the ablation transmurality achieved by "cut and sew" techniques. Studies of post-operative fibrillation recurrence attribute treatment failures to the lack of obtaining full lesion transmurality at the time of surgery. Unfortunately, no method or standard exists for validating in-vivo ablation transmurality. Using high-resolution optical mapping studies with Langendorff perfused heart preparations, we are able to correlate spatiotemporal electrical activity with ablation line transmurality, thus providing a means for validating ablation transmurality in order to quantify the type and number of ablation lines used in order to tailor ablation therapies to individual patient needs.
Keywords
biological effects of microwaves; cardiology; radiation therapy; surgery; Langendorff perfused heart preparations; ablation line transmurality; ablation transmurality; atrial fibrillation ablation; atrial tissue; lesion transmurality; normal sinus rhythm; optical mapping; post-operative fibrillation recurrence; radiofrequency ablations; spatiotemporal electrical activity; surgery; voltage-sensitive mapping; Atrial fibrillation; Biomedical optical imaging; Heart; Lesions; Medical treatment; Radio frequency; Rhythm; Spatiotemporal phenomena; Surgery; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
ISSN
1094-687X
Print_ISBN
0-7803-7789-3
Type
conf
DOI
10.1109/IEMBS.2003.1279538
Filename
1279538
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