Title :
Simulation of electromagnetic processes in microwave film resistors
Author :
Rubanovitch, M.G. ; Vostryakov, Yu V. ; Razinkin, V.P. ; Khrustalev, V.A. ; Matvejev, S.J.
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
This work presents the mathematical model for description of electromagnetic processes in a resistive film permitting to calculate the frequency characteristics of the input impedance and transfer factor of microwave planar resistors on the basis of an equivalent circuit, obtained through the method of the current bars.
Keywords :
microwave circuits; thick film resistors; thin film resistors; current bars method; electromagnetic process; equivalent circuit; frequency characteristics; input impedance; mathematical model; microwave film resistors; microwave planar resistors; resistive film; transfer factor; Attenuators; Bars; Equations; Equivalent circuits; Frequency; Impedance; Mathematical model; Microwave theory and techniques; Resistors; Surface resistance;
Conference_Titel :
Microwave Electronics: Measurements, Identification, Applications, 2003. MEMIA 2003. Proceedings of the 4th IEEE-Russia Conference
Print_ISBN :
5-7782-0439-6
DOI :
10.1109/MEMIA.2003.1282203
