DocumentCode
407707
Title
Superresolution measurement of non-specular wave scattering from building surface roughness
Author
Budiarto, Hary ; Horihata, Kenshi ; Haneda, Katsuyuki ; Takada, Jun-ichi
Author_Institution
Graduate Sch. of Sci. & Eng., Tokyo Inst. of Technol., Japan
Volume
1
fYear
2003
fDate
6-9 Oct. 2003
Firstpage
11
Abstract
This paper presents a superresolution measurement of non-specular scattering from 3D building surface roughness. The superresolution method was applied as an approach to handle signal parameters (DOA, TOA) of the individual incoming waves reflected from building surface roughness. In order to comprehend in detail the microscopic mechanisms of scattering, signal parameters are to be incorporated into the geometrical ray tracing. The results show that the multiple paths can be detected from many scatterers, such as ground, window glass, window frame, bricks surface, as well as directly from the transmitter. Most of the scattered waves arrive closely from specular directions. The calculation of glass and bricks reflection coefficient can be performed based on data measurement.
Keywords
electromagnetic wave reflection; electromagnetic wave scattering; multipath channels; radiowave propagation; ray tracing; surface roughness; 3D building surface roughness; DOA; TOA; brick surface reflection coefficient; directions of arrival; geometrical ray tracing; ground; incoming wave reflection; multipath propagation; multiple paths; nonspecular wave scattering; propagation prediction; radio environment; superresolution scattering measurement; times of arrival; window frame; window glass; Glass; Microscopy; Ray tracing; Rough surfaces; Scattering parameters; Signal resolution; Surface roughness; Surface waves; Transmitters; Windows;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference, 2003. VTC 2003-Fall. 2003 IEEE 58th
ISSN
1090-3038
Print_ISBN
0-7803-7954-3
Type
conf
DOI
10.1109/VETECF.2003.1284968
Filename
1284968
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