DocumentCode
408604
Title
Results from Vernier Scans at RHIC during the pp run 2001-2002
Author
Drees, A. ; Xu, Zhangbu ; Fox, Brendan ; Huang, Haibin
Author_Institution
Brookhaven Nat. Lab., Upton, NY, USA
Volume
3
fYear
2003
fDate
12-16 May 2003
Firstpage
1688
Abstract
Using the Vernier Scan or Van der Meer Scan technique, where one beam is swept stepwise across the other while measuring the collision rate as a function of beam displacement, the transverse beam profiles, the luminosity and the cross section can be measured. Data and results from the polarized proton run in the year 2001/02 are presented.
Keywords
colliding beam accelerators; ion accelerators; particle beam diagnostics; proton accelerators; storage rings; synchrotrons; AD 2001 to AD 2002; RHIC; Van der Meer Scan technique; Vernier Scans; beam displacement; collision rate; cross section; luminosity; polarized proton; transverse beam profiles; Area measurement; Counting circuits; Displacement measurement; Gaussian processes; Particle beams; Polarization; Production; Protons; Shape; Size measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
ISSN
1063-3928
Print_ISBN
0-7803-7738-9
Type
conf
DOI
10.1109/PAC.2003.1288637
Filename
1288637
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