Title :
Results from Vernier Scans at RHIC during the pp run 2001-2002
Author :
Drees, A. ; Xu, Zhangbu ; Fox, Brendan ; Huang, Haibin
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Abstract :
Using the Vernier Scan or Van der Meer Scan technique, where one beam is swept stepwise across the other while measuring the collision rate as a function of beam displacement, the transverse beam profiles, the luminosity and the cross section can be measured. Data and results from the polarized proton run in the year 2001/02 are presented.
Keywords :
colliding beam accelerators; ion accelerators; particle beam diagnostics; proton accelerators; storage rings; synchrotrons; AD 2001 to AD 2002; RHIC; Van der Meer Scan technique; Vernier Scans; beam displacement; collision rate; cross section; luminosity; polarized proton; transverse beam profiles; Area measurement; Counting circuits; Displacement measurement; Gaussian processes; Particle beams; Polarization; Production; Protons; Shape; Size measurement;
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Print_ISBN :
0-7803-7738-9
DOI :
10.1109/PAC.2003.1288637
