RHIC pressure rise and electron cloud

Author

Zhang, S.Y. ; Bai, M. ; Blaskiewicz, M. ; Cameron, P. ; Drees, A. ; Fischer, W. ; Gassner, D. ; Gullotta, J. ; He, P. ; Hseuh, H.C. ; Huang, H. ; Iriso-Ariz, U. ; Lee, R. ; Mackay, W.W. ; Oerter, B. ; Ptitsyn, V. ; Ponnaiyan, V. ; Roser, T. ; Satogata, T.

Author_Institution

Brookhaven Nat. Lab., Upton, NY, USA

Volume

1

fYear

2003

fDate

12-16 May 2003

Firstpage

54

Abstract

In RHIC high intensity operation, two types of pressure rise are currently of concern. The first type is at the beam injection, which seems to be caused by the electron multipacting, and the second is the one at the beam transition, where the electron cloud is not the dominant cause. The first type of pressure rise is limiting the beam intensity and the second type might affect the experiments background for very high total beam intensity. In this article, the pressure rises at RHIC are described, and preliminary study results are reported. Some of the unsettled issues and questions are raised, and possible counter measures are discussed.

Keywords

ion accelerators; particle beam bunching; particle beam diagnostics; synchrotrons; RHIC pressure rise; beam injection; beam transition; electron cloud; electron multipacting; Clouds; Coatings; Counting circuits; Electron beams; Energy measurement; Gold; Helium; Ion beams; Pressure measurement; Solenoids;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the

ISSN

1063-3928

Print_ISBN

0-7803-7738-9

Type

conf

DOI

10.1109/PAC.2003.1288839

Filename

1288839