• DocumentCode
    408863
  • Title

    Self-consistent, unbiased exclusion methods of emittance analysis

  • Author

    Stockli, Martin P. ; Welton, R.F. ; Keller, R.

  • Author_Institution
    SNS, Oak Ridge Nat. Lab., TN, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    12-16 May 2003
  • Firstpage
    527
  • Abstract
    We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainty. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.
  • Keywords
    SCF calculations; particle beam diagnostics; SCUBEEx; bias; ellipse size; emittance analysis; orientation; rms emittance; self-consistent method; self-consistent unbiased exclusion methods; shape; Background noise; Coordinate measuring machines; Laboratories; OWL; Particle beam measurements; Particle beams; Particle measurements; Position measurement; Shape; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
  • ISSN
    1063-3928
  • Print_ISBN
    0-7803-7738-9
  • Type

    conf

  • DOI
    10.1109/PAC.2003.1288967
  • Filename
    1288967