DocumentCode
408863
Title
Self-consistent, unbiased exclusion methods of emittance analysis
Author
Stockli, Martin P. ; Welton, R.F. ; Keller, R.
Author_Institution
SNS, Oak Ridge Nat. Lab., TN, USA
Volume
1
fYear
2003
fDate
12-16 May 2003
Firstpage
527
Abstract
We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the rms emittance as well as its associated uncertainty. The self-consistent, unbiased elliptical exclusion analysis, SCUBEEx, uses an exclusion ellipse to determine the bias from the data outside the ellipse, before calculating the emittance from the bias-subtracted data within the ellipse. Variations of the ellipse size, shape, and orientation allow for objectively estimating the bias and the rms emittance.
Keywords
SCF calculations; particle beam diagnostics; SCUBEEx; bias; ellipse size; emittance analysis; orientation; rms emittance; self-consistent method; self-consistent unbiased exclusion methods; shape; Background noise; Coordinate measuring machines; Laboratories; OWL; Particle beam measurements; Particle beams; Particle measurements; Position measurement; Shape; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
ISSN
1063-3928
Print_ISBN
0-7803-7738-9
Type
conf
DOI
10.1109/PAC.2003.1288967
Filename
1288967
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