DocumentCode
411709
Title
Micrometer resolution with (sub)-millimeter waves
Author
van der Valk, N.C.J. ; Planken, P. C M
Author_Institution
Delft Univ. of Technol., Netherlands
fYear
2003
fDate
6-6 June 2003
Abstract
We describe a new terahertz imaging method in which we generate and detect THz spot sizes as small as 10 /spl mu/m in the near field of a metal tip. Theoretically, our method allows for a resolution <100 nm.
Keywords
electro-optical effects; image resolution; submillimetre wave imaging; micrometer resolution; sub-millimeter waves; terahertz imaging; Distortion measurement; Frequency; Image resolution; Laser beams; Optical distortion; Optical imaging; Optical microscopy; Polarization; Probes; Submillimeter wave technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-748-2
Type
conf
Filename
1297790
Link To Document