DocumentCode :
413475
Title :
Metastability in boron-doped multicrystalline silicon wafers and solar cells
Author :
Dhamrin, Marwan ; Kayamori, Yuki ; Hashigami, Hiroshi ; Saitoh, Tadashi
Author_Institution :
Tokyo Univ. of Agric. & Technol., Japan
Volume :
3
fYear :
2003
fDate :
18-18 May 2003
Firstpage :
2905
Abstract :
Metastability of boron-doped multicrystalline silicon wafers and solar cells under illumination has been investigated. Lifetimes of boron-doped multicrystalline silicon wafer degrade very rapidly within the first 30 min under 1 sun illumination to about 40% of its initial values. Carrier lifetime distribution maps show that high lifetime regions degraded more than lower regions. The same tendency of rapid degradation is observed in B-doped conventional cast multicrystalline silicon solar cells where short circuit current, open circuit voltage and efficiency degrade very rapidly by only 3% within few minutes of illumination. Possibilities of elimination of light-induced degradation by means of using gallium as dopant instead of boron are investigated. Carrier lifetimes of Ga-doped wafers show certain stability under illumination. The same stability is found in Ga-doped solar cells.
Keywords :
boron; carrier lifetime; elemental semiconductors; gadolinium; heat transfer; short-circuit currents; silicon; solar cells; 30 min; Ga doped solar cell; Si:B; Si:Ga; boron doped multicrystalline silicon wafer; carrier lifetime distribution map; gallium doped multicrystalline silicon wafer; light induced degradation; metastability; open circuit voltage; short circuit current; solar cell; sun illumination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1305188
Link To Document :
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