• DocumentCode
    413477
  • Title

    Initial drop in I/sub sc/ of the field test c-Si PV modules in Japan

  • Author

    Hishikawa, Yoshihiro ; Morita, Kengo

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
  • Volume
    3
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    2916
  • Abstract
    Stability of photovoltaic (PV) modules has been investigated, based on about 2400 field test PV modules manufactured in 1990´s, which show better reliability than the earlier generation modules. The overall system performance showed no distinct change within the 10 years of field test. Some of the modules showed sign of various degradation modes. Among these, the initial drop in I/sub sc/ indicated that the c-Si modules showed reduction in I/sub sc/ by 1-5% within 1 year of outdoor exposure, then became stable. Experimental results showed that this do not strongly affect the long term stability of the PV modules, as the I/sub sc/ becomes stable in a very early stage of the operation. Spectral response measurement showed that the drop in I/sub sc/ is due to the decrease in the response for the red light and infrared light. Possible contributions from the changes in the optical properties of glass and EVA, and the metastability of c-Si solar cells are discussed. Other modes of instability such as the delamination and increase in R/sub s/ is also discussed.
  • Keywords
    delamination; elemental semiconductors; environmental degradation; glass; photovoltaic effects; reliability; short-circuit currents; silicon; solar cells; ultraviolet spectra; Japan; Si; c-Si solar cell; degradation; delamination; field test c-Si PV module; glass; infrared light; metastability; module stability; optical properties; photovoltaic module; reduction; reliability; short-circuit current; spectral response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305190