Title :
Analysis of weathered c-Si PV modules
Author :
Chianese, D. ; Realini, A. ; Cereghetti, N. ; Rezzonico, S. ; Bur, E. ; Friesen, G. ; Bernasconi, Anna
Author_Institution :
Univ. of Appl. Sci. of Southern Switzerland, Canobbio, Switzerland
Abstract :
The LEEE-TISO testing centre for PV components has, since 1991, carried out systematic tests, under real operating conditions, on the most important modules currently on the market. PV c-Si modules coming from production shows a typical degradation in performance when exposed to light of up to -5%. This initial degradation of c-Si modules takes place during the first hours of exposure. During the first year of operation some of the tested modules shows almost no further degradation and some a very small degradation. The long term degradation of c-Si modules has been extensively studied on one of the LEEE-TISO plants. In 21 years of service, the Arco solar ASI 16-2300 modules of the 10 kW TISO plant showed several signs of physical degradation. Yellowing of PVB encapsulant and hot-spots affected the module efficiency. Nevertheless, the results of the indoor performance measurements of all plant modules indicate that the ASI 16-2300 modules are still working in a very satisfactory manner.
Keywords :
delamination; elemental semiconductors; photovoltaic power systems; short-circuit currents; silicon; solar cells; solar power stations; 10 kW; Arco solar ASI 16-2300 module; LEEE-TISO plants; LEEE-TISO testing centre; PVB encapsulant yellowing; Si; hot spot; indoor performance measurements; module efficiency; performance degradation; weathered Si photovoltaic module analysis;
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3