DocumentCode
413511
Title
Aluminium-induced crystallisation of amorphous silicon: influence of oxidation conditions
Author
Schneider, J. ; Klein, J. ; Muske, M. ; Schöpke, A. ; Gall, S. ; Fuhs, W.
Author_Institution
Hahn-Meitner-Inst., Berlin, Germany
Volume
1
fYear
2003
fDate
18-18 May 2003
Firstpage
106
Abstract
Seed layer concepts are promising for polycrystalline silicon thin film solar cells. Such seed layers can be formed by the aluminium-induced layer exchange process. In this process an oxide layer between Al and a-Si is needed to form a continuous seed layer. The role of this oxide layer is under investigation in this paper. We found that the oxide layer thickness determines the silicon grain size in the seed layer whereas the annealing temperature determines the process time.
Keywords
aluminium; amorphous semiconductors; annealing; crystallisation; elemental semiconductors; grain size; oxidation; semiconductor thin films; silicon; solar cells; Al; Si; aluminium-induced layer exchange process; annealing temperature; crystallisation; grain size; oxidation; oxide layer thickness; polycrystalline silicon; process time; seed layer; thin film solar cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location
Osaka, Japan
Print_ISBN
4-9901816-0-3
Type
conf
Filename
1305231
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