• DocumentCode
    413511
  • Title

    Aluminium-induced crystallisation of amorphous silicon: influence of oxidation conditions

  • Author

    Schneider, J. ; Klein, J. ; Muske, M. ; Schöpke, A. ; Gall, S. ; Fuhs, W.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    106
  • Abstract
    Seed layer concepts are promising for polycrystalline silicon thin film solar cells. Such seed layers can be formed by the aluminium-induced layer exchange process. In this process an oxide layer between Al and a-Si is needed to form a continuous seed layer. The role of this oxide layer is under investigation in this paper. We found that the oxide layer thickness determines the silicon grain size in the seed layer whereas the annealing temperature determines the process time.
  • Keywords
    aluminium; amorphous semiconductors; annealing; crystallisation; elemental semiconductors; grain size; oxidation; semiconductor thin films; silicon; solar cells; Al; Si; aluminium-induced layer exchange process; annealing temperature; crystallisation; grain size; oxidation; oxide layer thickness; polycrystalline silicon; process time; seed layer; thin film solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305231