DocumentCode :
413602
Title :
Degradation study on a commercial copper indium diselenide module
Author :
Lam, King-hang ; Close, Josie ; Durisch, Wilhelm
Author_Institution :
Dept. of Archit., Hong Kong Univ., China
Volume :
1
fYear :
2003
fDate :
18-18 May 2003
Firstpage :
479
Abstract :
This paper will illustrate the collaborative research conducted by Paul Scherrer Institute and The University of Hong Kong on the behaviour of a commercially available CIS module under real operating conditions. Tests done under different cell temperature, solar irradiance, and air mass conditions facilitate the development of a semi-empirical efficiency model on a newly purchased CIS module. The tests were repeated after one year´s exposure to sunlight. The system set-up, measuring procedures, and test results are presented. Following detailed analysis of the results, it is suggested that the PV industry broadens disclosure of module parameters in future technical data published.
Keywords :
copper compounds; indium compounds; semiconductor device models; semiconductor thin films; solar cells; sunlight; ternary semiconductors; 1 year; CIS module; CuInSe/sub 2/; air mass conditions; cell temperature; degradation; real operating conditions; semi-empirical efficiency model; solar irradiance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1305325
Link To Document :
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