• DocumentCode
    413654
  • Title

    Modelling low energy proton radiation effects on solar cells

  • Author

    Messenger, S.R. ; Burke, E.A. ; Morton, T.L. ; Summers, G.P. ; Walters, R.J. ; Warner, J.H.

  • Author_Institution
    SFA Inc., Largo, MD, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    716
  • Abstract
    Past work has shown that the degradation of gallium arsenide solar cells in space radiation environments can be described with a single curve for a wide range of incident particle energies using the displacement damage dose (D/sub d/) approach. This greatly simplifies the prediction of the performance of GaAs solar cells exposed to complex particle spectra. A similar approach has not been applied to silicon solar cells because the large diffusion length in silicon means that protons of relatively high energy lose a significant fraction of their energy in the active region of the cell. The proton energy is, therefore, not well defined in the device. In this paper we show how the Monte Carlo code SRIM can be used to extend the D/sub d/ approach to cases where this occurs. The analysis will be applied to both single junction Si and GaAs solar cells. Space prediction comparisons will also be made using both the experimentally-derived (JPL) and simulation-derived (SRIM) relative damage coefficients (RDCs) for maximum power (P/sub max/) in Si solar cells.
  • Keywords
    III-V semiconductors; Monte Carlo methods; elemental semiconductors; gallium arsenide; proton effects; radiation hardening (electronics); semiconductor process modelling; silicon; solar cells; GaAs; Monte Carlo code; SRIM; Si; complex particle spectra; diffusion length; displacement damage dose approach; low energy proton radiation effect; maximum power; relative damage coefficients; solar cell; space prediction; space radiation environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305382