• DocumentCode
    413804
  • Title

    Plasma etching for industrial in-line processing of c-Si solar cells

  • Author

    Rentsch, Jochen ; Emanuel, G. ; Schetter, C. ; Aumann, T. ; Theirich, D. ; Gentischer, J. ; Roth, K. ; Fritzsche, M. ; Dittrich, K.-H. ; Preu, R.

  • Author_Institution
    Fraunhofer-Inst. fur Solare Energiesysteme, Freiburg, Germany
  • Volume
    2
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    1376
  • Abstract
    Thinner wafers and the reduction of breakage losses make it attractive for solar cell manufacturers to use in-line production systems. Closing the gap between diffusion and in-line silicon nitride deposition systems a plasma etching system has been designed suitable for a throughput of 1000 wafer/h with an automated transport system. Different plasma sources appropriate for etching large areas were tested and etch rates of around 13 /spl mu/m/min for saw damage removal could be reached with sufficient homogeneity. For phosphorous glass (PSG) removal selectivities between PSG and silicon above 10 could be achieved with a CF/sub 4//C/sub 2/H/sub 4/ etch gas mixture with sufficient PSG etch rates of around 80 nm/min. Solar cells processed with the plasma PSG removal step show slightly decreased efficiencies attributed to the plasma induced damage to the emitter layer and the silicon bulk. Further process optimization is needed to reduce this damage.
  • Keywords
    amorphous semiconductors; elemental semiconductors; phosphosilicate glasses; plasma sources; silicon; solar cells; sputter etching; Si solar cells; automated transport system; breakage loss reduction; diffusion; etch gas mixture; etch rate; homogeneity; industrial inline processing; inline production systems; inline silicon nitride deposition system; phosphorous glass removal; plasma etching system; plasma induced damage; plasma sources; process optimization; solar cell manufacturers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1306178