DocumentCode
413808
Title
Record efficiency of 16.7% in EFG ribbon silicon
Author
Geiger, Patric ; Hahn, Giso ; Fath, Peter
Author_Institution
Fachbereich Phys., Konstanz Univ., Germany
Volume
2
fYear
2003
fDate
18-18 May 2003
Firstpage
1392
Abstract
Recently obtained results of a process monitoring based on spatially resolved lifetime measurements revealed that bulk lifetime values above 300 /spl mu/s can be reached within edge-defined film-fed growth (EFG) silicon ribbons with the help of gettering and hydrogen passivation steps. Therefore, recombination losses at the wafer backside have to be considered in this material with low as grown lifetimes. The solar cell processing sequence has been adapted to the needs of this material. Besides phosphorous gettering and remote hydrogen plasma passivation a screen printed back surface field has been implemented instead of an evaporated and subsequently alloyed thin Al BSF used for Al gettering. This allows to make use of low energy photons in regions with very high bulk lifetimes. In this way an independently confirmed solar cell efficiency of 16.7% has been obtained which is the highest value that has been reported so far.
Keywords
aluminium; elemental semiconductors; getters; hydrogen; passivation; phosphorus; plasma materials processing; semiconductor thin films; silicon; solar cells; surface diffusion; Al; Al gettering; EFG ribbon silicon; H; P; Si; edge defined film fed growth silicon ribbons; hydrogen passivation; low energy photons; phosphorous gettering; process monitoring; recombination losses; remote hydrogen plasma passivation; screen printed back surface field; semiconductor thin films; solar cell efficiency; solar cell processing; spatially resolved lifetime measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location
Osaka, Japan
Print_ISBN
4-9901816-0-3
Type
conf
Filename
1306182
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