A High Resolution Displacement Measurement System Based on Time-to-Digital Converter

Author

Cunlong Li ; Weimin Chen ; Peng Zhang ; Daqing Zheng ; Shiyong Chen ; Rong Yan

Author_Institution

Key Lab. for Optoelectron. Technol. & Syst., Chongqing Univ., Chongqing, China

Volume

24

Issue

12

fYear

2014

fDate

Dec. 2014

Firstpage

902

Lastpage

904

Abstract

A microwave interferometry displacement measurement system based on time-to-digital converter (TDC) is proposed. As the TDC has advantages of high time resolution and linearity, it is introduced to replace common phase detector of microwave interferometer. The system is operating at 2.4 GHz in two-stage heterodyne, and its theoretically estimated displacement resolution is about 3 μm. Under the experimental condition of 50 μm moving step, measured maximum error is 30 μm with the standard deviation of 10.9 μm and the linearity is 0.9997.

Keywords

UHF measurement; displacement measurement; interferometry; measurement systems; microwave measurement; time-digital conversion; TDC; common phase detector; frequency 2.4 GHz; high resolution displacement measurement system; microwave interferometer; microwave interferometry displacement measurement system; time-to-digital converter; two-stage heterodyne; Displacement measurement; Linearity; Microwave measurement; Phase detection; Displacement measurement; high resolution; linearity; phase detection; time-to-digital converter;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2014.2303168

Filename

6827222