• DocumentCode
    414269
  • Title

    Atomic-scale positioning reference grid system for miniature robots with embedded scanning tunnelling capability

  • Author

    St-Jacques, Dominic ; Boitani, Thomas ; Dumas, Pierre-Main ; Ducas, Marc-Antoine ; Fortin, Marc-Antoine ; Martel, Sylvain

  • Author_Institution
    Dept. of Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    2
  • fYear
    2004
  • fDate
    April 26-May 1, 2004
  • Firstpage
    1339
  • Abstract
    The concept of a nanorobotic platform based on a fleet of miniature instrumented robots capable of atomic-scale operations has been proposed. Although such an approach offers significant advantages compared to more traditional approaches, many technical challenges remain to be resolved. As such, being able to position the instrument embedded onto each robot with atomic-scale precision is a critical, yet challenging problem. All known positioning techniques, including, but not limited to, interferometry, cannot be applied in this case. This paper suggests a novel approach where coarse positioning through optical means is coupled to surface analysis to achieve atomic scale precision. A special line-based pattern engraved on a surface is used to guide and accelerate the robot´s instrument positioning by delimiting a matrix of work windows where atomic positioning through atom counting takes places. The NanoWalker research project serves as an implementation contest for this grid. Its current version is etched on Highly Oriented Pyrolytic Graphite (HOPG) and imaged with commercial Scanning Probe Microscopes (SPM).
  • Keywords
    etching; graphite; microrobots; multi-robot systems; nanopositioning; scanning tunnelling microscopy; NanoWalker research project; SPM imaging; atom counting; atomic scale positioning reference grid system; atomic scale precision; coarse positioning; highly oriented pyrolytic graphite; interferometry; line based pattern engraving; miniature instrumented robots; nanorobotic platform; optical analysis; scanning probe microscopy imaging; scanning tunnelling microscopy; surface analysis; Acceleration; Atom optics; Etching; Instruments; Microscopy; Optical coupling; Optical interferometry; Probes; Robots; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 2004. Proceedings. ICRA '04. 2004 IEEE International Conference on
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-8232-3
  • Type

    conf

  • DOI
    10.1109/ROBOT.2004.1308010
  • Filename
    1308010