Statistical estimation of circuit timing vulnerability due to leakage-induced power grid voltage drop

Author

Ferzli, Had A. ; Najm, Farid N.

Author_Institution

Dept. of ECE, Univ. of Toronto, Ont., Canada

fYear

2004

fDate

2004

Firstpage

17

Lastpage

24

Abstract

Statistical Vt variations lead to large variations of leakage current, which cause statistical voltage drops on the power grid that can affect Circuit timing. We propose a statistical analysis technique whereby variances of the leakage currents are used to estimate the susceptibility to timing violations due to leakage-induced voltage drops.

Keywords

covariance analysis; covariance matrices; electric potential; integrated circuit reliability; leakage currents; log normal distribution; timing; circuit timing vulnerability; covariance matrix; critical path; integrated circuits; joint probability distribution; joint statistics; leakage current variances; leakage-induced power grid voltage drop; multivariate lognormal; power grid; statistical estimation; statistical voltage drops; within-die variations; Contracts; Electricity supply industry; Electronics industry; Integrated circuit technology; Leakage current; Power grids; Semiconductor device measurement; Statistical analysis; Threshold voltage; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on

Print_ISBN

0-7803-8528-4

Type

conf

DOI

10.1109/ICICDT.2004.1309896

Filename

1309896