• DocumentCode
    41502
  • Title

    Development of a Ray-Tracing Optical Simulation Model of Plasma Display Panel

  • Author

    Byung-Yun Joo ; Jae-Hyeon Ko

  • Author_Institution
    AMLCD Div., Samsung Electron., Gihung, South Korea
  • Volume
    10
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    49
  • Lastpage
    56
  • Abstract
    A ray-tracing model is developed for accurate optical simulation of plasma display panel (PDP). Thorough spectroscopic characterization of materials properties is carried out, based on which four types of material models of PDP layer materials are developed and incorporated in the cell model. Four test panels with different bus electrode structures are fabricated, the geometrical structure of which is measured and reflected in the ray-tracing model. Plasma fluid simulation is carried out to derive the spatial distribution of the ultraviolet light in the cell and the total number of Xe species. Simulation results show that the simulated panel reflectances are consistent with the experimental values within 3% error. In addition, the normalized angular luminance profiles obtained by simulation agree well with the measured results. However, the on-axis luminance value of the PDP panel, which is affected by both optical and plasma simulation, cannot be predicted accurately by this study.
  • Keywords
    brightness; electrodes; plasma displays; ray tracing; PDP layer material; Xe species; bus electrode structure; geometrical structure; materials property; normalized angular luminance profile; on-axis luminance value; panel reflectances simulation; plasma display panel; plasma fluid simulation; plasma simulation; ray-tracing optical simulation model; spatial distribution; spectroscopic characterization; ultraviolet light; Glass; Mathematical model; Partial discharges; Phosphors; Ray tracing; Reflectivity; Optical design; phosphors; photoluminescence; plasma displays; ray tracing;
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2013.2284781
  • Filename
    6623115