• DocumentCode
    415532
  • Title

    Static and dynamic characteristics of the 2.5kV/500A IGCTs

  • Author

    Kim, S.C. ; Kim, H.W. ; Seo, K.S. ; Zhang, C.L. ; Kim, E.D.

  • Author_Institution
    Adv. Mater. & Application Res. Lab., Korea Electrotcchnology Res. Inst., Chnag Won, South Korea
  • Volume
    1
  • fYear
    2004
  • fDate
    16-19 May 2004
  • Firstpage
    171
  • Abstract
    IGCT thyristor has many superior characteristics compared with the GTO thyristor. For example, snubberless turnoff capability, short storage time, high turn-on capability, small turn-off gate charge and low total power loss of the application system containing device and peripheral parts such as anode reactor and snubber capacitance. In these characteristics, particularly turn-off capabilities are much important parameter because applications conditions of conventional GTO thyristor are mainly restricted by the limit of these disadvantages of the GTO thyristor. The basic structure of the GCT thyristor is the same as that of the GTO thyristor. This makes the blocking voltage higher and the controllable on-state current higher. The turn-off characteristic of the GCT is influenced by the minority carrier lifetime and the performance of the gate drive circuit. In this paper, we present turn-off characteristics of the 2.5kV/500A PT(Punch-through) type IGCT as a function of the minority carrier lifetime and variation of the doping profile shape of p-base region. Current overshoot characteristics of the IGCT via the doping profile of the p-base region also present.
  • Keywords
    carrier lifetime; doping profiles; minority carriers; thyristors; 2.5 kV; 2.5kV/500A IGCTs; 500 A; anode reactor; application system; blocking voltage; controllable on-state current; doping profile; dynamic characteristics; gate drive circuit; high turn-on capability; low total power loss; minority carrier lifetime; p-base region; short storage time; small turn-off gate charge; snubber capacitance; snubberless turn-off capability; thyristor; Anodes; Capacitance; Charge carrier lifetime; Circuits; Doping profiles; Inductors; Shape; Snubbers; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2004. 24th International Conference on
  • Print_ISBN
    0-7803-8166-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2004.1314583
  • Filename
    1314583