DocumentCode
415861
Title
Cooling challenges for silicon integrated circuits
Author
Prakash, Mani
Author_Institution
Enterprise Platform Group, Intel Corp., DuPont, WA, USA
Volume
2
fYear
2004
fDate
1-4 June 2004
Firstpage
705
Abstract
Microprocessor design with varying styles and complexities exhibit power density gradients across the die. 300+ W/cm2 local densities a.k.a ´hot spots´ are seen and it is a continuing challenge to cool these hot spots in designing thermal solutions. Hot spots will exacerbate the cooling margin in system and packaging thermal solutions. Depending on the market segment (mobile, desktop, server) and feature densities in the system (HDD, Memory etc.), the industry faces the challenge of staying in cost effective air cooling regime. In the Enterprise space, the feature rich thin rack and blade servers are thermally pushing the limits or air cooling. Additionally, the 24/7 (24 hours, 7 days a week) use environment of servers demand highly reliable and often redundant cooling solutions and any new cooling strategy needs to meet or exceed the well established and industry accepted reliability expectations, common of air cooling solutions. The package solutions need to quickly spread the ´hot spot´ heat to the next level and the system thermal solutions need to cost effective and highly reliable.
Keywords
cooling; elemental semiconductors; heat sinks; microprocessor chips; monolithic integrated circuits; reliability; silicon; thermal management (packaging); Si; air cooling; hot spots; microprocessor design; packaging thermal solutions; power density gradients; reliability; silicon integrated circuits; Blades; Cooling; Costs; Microprocessors; Packaging; Power distribution; Power system reliability; Silicon; Temperature; Thermal factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN
0-7803-8357-5
Type
conf
DOI
10.1109/ITHERM.2004.1318361
Filename
1318361
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