Title :
Prediction of process-induced warpage of IC packages encapsulated with thermosetting polymers
Author :
Yang, D.G. ; Jansen, K.M.B. ; Ernst, L.J. ; Zhang, G.Q. ; van Driel, W.D. ; Bressers, H.J.L. ; Fan, X.J.
Author_Institution :
Delft Univ. of Technol., Netherlands
Abstract :
One critical issue for manufacturing of map-molded packages is the warpage induced during the molding process. A cure-dependent viscoelastic constitutive model has been established to describe the evolution of material properties during the curing process of a thermosetting polymer. The evolution of the rubbery moduli is described by a model based on scaling analysis and is measured with a new method. The relaxation behavior of the transient part is described by the cure-dependent relaxation amplitude and reduced relaxation times which are based on the time-conversion superposition principle. The cure-dependent parameters are characterized by using an combinational approach of DMA and DSC measurements. The predictions agree well with the experimental results. FEM is conducted for QFN map molding processes, and prediction of the warpage induced during the curing process and the cooling down is made. The results show that warpage induced during the curing process has a significant contribution on the total warpage. Furthermore, when decreasing the number of maps, the contribution of curing-induced warpage significantly increases.
Keywords :
deformation; differential scanning calorimetry; encapsulation; finite element analysis; integrated circuit packaging; internal stresses; moulding; polymers; relaxation; viscoelasticity; DMA measurement; DSC measurement; FEM; IC packages; QFN map molding processes; cure-dependent viscoelastic constitutive model; curing-induced warpage; encapsulation; epoxy resin; map-molded packages; molding process; process-induced warpage; quad flat nonlead package; relaxation amplitude; relaxation times; residual stresses; rubbery moduli; scaling analysis; thermosetting polymers; time-conversion superposition principle; Curing; Elasticity; Electronic packaging thermal management; Integrated circuit packaging; Polymers; Residual stresses; Strain measurement; Temperature; Thermal stresses; Viscosity;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1319321