• DocumentCode
    415983
  • Title

    A study on the reliability and thermo-mechanical properties of gold ribbon wire bonding

  • Author

    Tan, Chee Wei ; Chan, Y.C.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • Volume
    1
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    377
  • Abstract
    The major goal of this research is to study the thermomechanical properties of Au ribbon wire bonding and its reliability in a TO-receiver. The metallurgical behavior has effects on the wire looping and thus the mechanical strength of the ribbon wire. It was studied by performing vertical pull tests and bond shear tests; its pull force, interfacial shear force and failure mode was recorded. These mechanical tests were also employed to analyze samples that have undergone an aging test (150°C). Wire pull force and shear force versus aging test time were recorded and the failure mode obtained during shear test was studied. Correlation between the bond area and wire bond strength was also reported. Metallurgical sectioning was also performed on the aged samples at each aging test interval. A mathematical model was used to predict the unit change in resistance of gold ribbon wire in various surrounding temperatures and strain states. The investigations involved environmental temperatures, i.e., 25, 85, 100 and 125°C were employed. In the elastic range and the initiation of the plastic range, the variations in the electrical resistance of ribbon wire are dominated by the thermal effect. However, tensile strain replaces the thermal effect within the later half of the plastic range.
  • Keywords
    ageing; electric resistance; failure analysis; gold; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; lead bonding; mechanical strength; metallurgy; shear strength; tensile strength; 100 degC; 125 degC; 150 degC; 25 degC; 85 degC; Au; TO-receiver; aging; bond area/wire bond strength correlation; bond shear test; elastic range; environmental temperatures; failure mode analysis; gold ribbon wire bonding; interfacial shear force; mechanical strength; metallurgical behavior; plastic range; pull force; ribbon reliability; ribbon resistance change; ribbon thermo-mechanical properties; tensile strain; thermal effect; vertical pull test; wire looping; Aging; Bonding; Electric resistance; Gold; Performance evaluation; Plastics; Temperature; Testing; Thermomechanical processes; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1319368
  • Filename
    1319368