DocumentCode
416013
Title
Ultra wide bandwidth performance of high-density wiring interposer for 3D packaging
Author
Kikuchi, Katsuya ; Segawa, Shigemasa ; Jung, Eun-Sil ; Nemoto, Yoshihiko ; Umemoto, Mitsuo ; Nakagawa, Hiroshi ; Tokoro, Kazuhiko ; Aoyagi, Masahiro
Author_Institution
NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan
Volume
1
fYear
2004
fDate
1-4 June 2004
Firstpage
630
Abstract
We have demonstrated a high-density wiring interposer for 10 GHz 3D packaging using a photosensitive multiblock copolymerized polyimide. This new polyimide can realize micron-sized fine patterns without the pattern shrinkage because of not requiring high-temperature thermal curing. The polyimide has good electric properties such as high breakdown voltage and low dielectric constant. Therefore, it is considered that by introducing this photosensitive polyimide as an insulator of the interposer, a high-performance interposer for LSI packaging can be realized. We confirmed experimentally that the high-density wiring interposer could be fabricated using the polyimide and the gold metal. From time domain reflectometry (TDR) measurement by using a specially prepared 20-μm-pitch microwave contact probe, it was found that the characteristic impedance of the stripline is within 55.2 Ω±11.5 % at the central 10-mm-square area of the interposer.
Keywords
integrated circuit interconnections; integrated circuit measurement; integrated circuit metallisation; integrated circuit packaging; large scale integration; plastic packaging; polymer blends; strip line circuits; time-domain reflectometry; 10 GHz; 20 micron; 3D packaging; 55.2 ohm; Au; LSI packaging; breakdown voltage; dielectric constant; fine patterns; gold metal; high-density wiring interposer; microwave contact probe; pattern shrinkage; photosensitive multiblock copolymerized polyimide; photosensitive polyimide insulator; polyimide electric properties; stripline characteristic impedance; thermal curing; time domain reflectometry measurement; ultra wide bandwidth performance; Bandwidth; Curing; Dielectric constant; Dielectrics and electrical insulation; Gold; Large scale integration; Packaging; Polyimides; Reflectometry; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN
0-7803-8365-6
Type
conf
DOI
10.1109/ECTC.2004.1319404
Filename
1319404
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