DocumentCode
416236
Title
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
Author
Jerke, Goran ; Lienig, Jens ; Scheible, Jurgen
Author_Institution
Robert Bosch GmbH, Germany
fYear
2004
fDate
7-11 July 2004
Firstpage
181
Lastpage
184
Keywords
Algorithm design and analysis; Automotive electronics; Conducting materials; Current density; Electromigration; Integrated circuit interconnections; Integrated circuit layout; Integrated circuit reliability; Routing; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location
San Diego, CA, USA
ISSN
0738-100X
Print_ISBN
1-51183-828-8
Type
conf
Filename
1322466
Link To Document